Detection of Nanometer Displacement in Optical-Tweezers and Its Related Measuring Errors

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Chinese Journal of Lasers >Volume 31 >Issue 6 >Page 729 > Article

Chinese Journal of Lasers
Vol. 31, Issue 6, 729 (2004)

Detection of Nanometer Displacement in Optical-Tweezers and Its Related Measuring Errors

[in Chinese]^1、*, [in Chinese]¹, [in Chinese]², [in Chinese]², [in Chinese]², and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Detection of Nanometer Displacement in Optical-Tweezers and Its Related Measuring Errors[J]. Chinese Journal of Lasers, 2004, 31(6): 729 Copy Citation Text

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Abstract

Optical Tweezers can be used in measuring nanometer displacements of a particle with several micron diameters. Methods of measurement and data processing, error sources are analyzed. The dynamic image analysis methods including the gray centroid method and new developed methods

Keywords

data-processing methods measuring error nanometer displacement optical-tweezers pico-Newton force optoelectronics

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