Quantitative Identification and Comparative Study of Defects Based on Phase and Surface Temperatures

Lin CHEN; Minqian LI; Feng GAO; Min LIU; Chi ZHANG

Journals >Infrared Technology >Volume 44 >Issue 6 >Page 635 > Article

Infrared Technology
Vol. 44, Issue 6, 635 (2022)

Quantitative Identification and Comparative Study of Defects Based on Phase and Surface Temperatures

Lin CHEN^1、*, Minqian LI¹, Feng GAO¹, Min LIU², and Chi ZHANG¹

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¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

CHEN Lin, LI Minqian, GAO Feng, LIU Min, ZHANG Chi. Quantitative Identification and Comparative Study of Defects Based on Phase and Surface Temperatures[J]. Infrared Technology, 2022, 44(6): 635 Copy Citation Text

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References

[2] LIU J Y, GONG J L, QIN L, et al. Three-dimensional visualization of subsurface defect using lock-in thermography[J]. International Journal of' Thermophysics, 2015, 36(5/6): 1226-1235.

[11] WEI Yanjie, SU Zhilong, MAO Shuangshuang, et al. An infrared defect sizing method based on enhanced phase images[J]. Sensors, 2020, 20(13): E3626-E3626.

CHEN Lin, LI Minqian, GAO Feng, LIU Min, ZHANG Chi. Quantitative Identification and Comparative Study of Defects Based on Phase and Surface Temperatures[J]. Infrared Technology, 2022, 44(6): 635

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