• Electronics Optics & Control
  • Vol. 24, Issue 9, 64 (2017)
ZHANG Yu-xiang1, WU Ming-gong1, WEN Xiang-xi1, WANG Xiao-rong1, and CHU Hong-shuai2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2017.09.014 Cite this Article
    ZHANG Yu-xiang, WU Ming-gong, WEN Xiang-xi, WANG Xiao-rong, CHU Hong-shuai. Survivability Measurement for Airline Network Based on Edge Failure[J]. Electronics Optics & Control, 2017, 24(9): 64 Copy Citation Text show less

    Abstract

    According to the specific functions and characteristics of airline network,two new measurements for network survivability were put forward.The transport reliability measurement was given based on network throughput taking the flow as the Edge Weight (EW).The accessibility measurement was proposed based on the link situation among nodes,which can accurately reflect the network connectivity.At last,simulation was carried out to verify the two proposed measurements by using two attack models based on incomplete information conditions.The result shows that:1) Under EW attack strategy,the network has a bad transport reliability,and the transport reliability decreases more quickly and obviously as the acquired information quantity increases;While the accessibility behaves well,and it shows a trend of slow descent as the acquired information quantity increases;and 2) Under Unweighted Edge Betweenness (UEB) attack strategy,the network has fine transport reliability and accessibility,but the response to the acquired information quantity is different:The transport reliability hardly changes as the acquired information quantity increases,while the accessibility has a certain acceleration of descent.Therefore,the two measurements can reflect the survivability under two attack strategies from two aspects,and have a good ability for measurement,which verifies the method.
    ZHANG Yu-xiang, WU Ming-gong, WEN Xiang-xi, WANG Xiao-rong, CHU Hong-shuai. Survivability Measurement for Airline Network Based on Edge Failure[J]. Electronics Optics & Control, 2017, 24(9): 64
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