• Acta Photonica Sinica
  • Vol. 46, Issue 8, 823002 (2017)
CHEN Wen-bai1、*, YE Ji-xing1, MA Hang1, and LI Deng-hua1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/gzxb20174608.0823002 Cite this Article
    CHEN Wen-bai, YE Ji-xing, MA Hang, LI Deng-hua. Thickness Estimation Method for Every Functional Layer of QLEDs[J]. Acta Photonica Sinica, 2017, 46(8): 823002 Copy Citation Text show less
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    CHEN Wen-bai, YE Ji-xing, MA Hang, LI Deng-hua. Thickness Estimation Method for Every Functional Layer of QLEDs[J]. Acta Photonica Sinica, 2017, 46(8): 823002
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