Xue Yang, Dan Zhang, Anmin Chen, Suyu Li, Yuanfei Jiang, Mingxing Jin. Influence of Distance Between Focusing Lens and Sample Surface on Atomic Line and Ionic Line Intensities of Laser-Induced Silicon Plasmas[J]. Chinese Journal of Lasers, 2019, 46(11): 1111001
- Chinese Journal of Lasers
- Vol. 46, Issue 11, 1111001 (2019)
Fig. 1. Schematics. (a) Experimental setup for analyzing influence of LTSD on spectral intensity in LIBS;(b) relationship between sample location and LTSD
Fig. 2. Typical emission spectra of laser-induced silicon plasmas for three distances when laser energy is 30 mJ. (a) 85.5 mm; (b) 93.5 mm; (c) 96.0 mm
Fig. 3. Peak intensities of Si(I) 390.55 nm line and Si(II) 385.60 nm line vary with the LTSD when laser energy is 30 mJ
Fig. 4. Peak intensities of line versus LTSD for different laser energies. (a) Si(I) 390.55 nm line; (b) Si(II) 385.60 nm
Fig. 5. Ratio of Si(II) line and Si(I) line peak intensities as function of LTSD for different laser energies
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