Sampling of a Certain Accelerometer in Reliability Life Testing

LUO Geng; ZHANG Pan; TANG Pingjian; LIU Xun

doi:10.3969/j.issn.1671-637x.2023.03.018

Journals >Electronics Optics & Control >Volume 30 >Issue 3 >Page 101 > Article

Electronics Optics & Control
Vol. 30, Issue 3, 101 (2023)

Sampling of a Certain Accelerometer in Reliability Life Testing

LUO Geng¹, ZHANG Pan¹, TANG Pingjian¹, and LIU Xun²

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: 10.3969/j.issn.1671-637x.2023.03.018 Cite this Article

LUO Geng, ZHANG Pan, TANG Pingjian, LIU Xun. Sampling of a Certain Accelerometer in Reliability Life Testing[J]. Electronics Optics & Control, 2023, 30(3): 101 Copy Citation Text

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References

[2] BAI D S, CHUN Y R.Optimum simple step-stress accelerated life tests with competing causes of failure［J］.IEEE Transactions on Reliability, 1991, 40(5):622-627.

[3] PASCUAL F.Accelerated life test planning with independent Weibull competing risks with known shape parameter［J］.IEEE Transactions on Reliability, 2007, 56(1):85-93.

[4] LI X Y, JIANG T M.Optimal design for step-stress accelerated degradation testing with competing failure modes［C］//Proceedings of Annual Reliability and Maintainability Symposium.Fort Worth:IEEE, 2009:64-68.

[5] LEE J S, PAN R.Analyzing step-stress accelerated life testing data using generalized linear models［J］.IIE Transactions, 2010, 42(8):589-598.

[7] DEVORE J L.Probability and statistics for engineering and the sciences［M］.Monterey:Brooks/Cole Publishing Co., 1982.

[8] ADCOCK C.Sample size determination:a review［J］.Journal of the Royal Statistical Society Series D(The Statistician), 1997, 46(2):261-283.

LUO Geng, ZHANG Pan, TANG Pingjian, LIU Xun. Sampling of a Certain Accelerometer in Reliability Life Testing[J]. Electronics Optics & Control, 2023, 30(3): 101

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