Qualification of superpolished substrates for laser-gyro by surface integrated scatter measurement

Zhimeng Wei; Xingwu Long; Kaiyong Yang

doi:10.3788/COL20100802.0181

Journals >Chinese Optics Letters >Volume 8 >Issue 2 >Page 181 > Article

Chinese Optics Letters
Vol. 8, Issue 2, 181 (2010)

Qualification of superpolished substrates for laser-gyro by surface integrated scatter measurement

Zhimeng Wei, Xingwu Long, and Kaiyong Yang

Author Affiliations

College of Optoelectric Science and Engineering, National University of Defense Technology, Changsha 410073, China

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DOI: 10.3788/COL20100802.0181 Cite this Article Set citation alerts

Zhimeng Wei, Xingwu Long, Kaiyong Yang. Qualification of superpolished substrates for laser-gyro by surface integrated scatter measurement[J]. Chinese Optics Letters, 2010, 8(2): 181 Copy Citation Text

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Zhimeng Wei, Xingwu Long, Kaiyong Yang. Qualification of superpolished substrates for laser-gyro by surface integrated scatter measurement[J]. Chinese Optics Letters, 2010, 8(2): 181

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