• Acta Photonica Sinica
  • Vol. 52, Issue 5, 0552215 (2023)
Fan WAN1,2, Yue ZHONG1,*, Zhongquan QU1, Zhi XU1..., Hui ZHANG1 and Yang PENG1,2|Show fewer author(s)
Author Affiliations
  • 1Yunnan Observatories, Chinese Academy of Sciences, Kunming 650217, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/gzxb20235205.0552215 Cite this Article
    Fan WAN, Yue ZHONG, Zhongquan QU, Zhi XU, Hui ZHANG, Yang PENG. High-precision Measurement Methods Research of Phase Retardance of Waveplates at 0°~360°[J]. Acta Photonica Sinica, 2023, 52(5): 0552215 Copy Citation Text show less
    Optical schematic diagram of measurement for waveplates
    Fig. 1. Optical schematic diagram of measurement for waveplates
    Condition number(condD2)of system matrix D
    Fig. 2. Condition number(condD2)of system matrix D
    Optical photograph of measurement system for waveplate
    Fig. 3. Optical photograph of measurement system for waveplate
    The measured results of the fluctuation of the radiant intensity of the light source
    Fig. 4. The measured results of the fluctuation of the radiant intensity of the light source
    Simulating the variation of the waveplate's retardation error(Δδ)with retardation(δ)under the influence of each single random error
    Fig. 5. Simulating the variation of the waveplate's retardation error(Δδ)with retardation(δ)under the influence of each single random error
    The influence of the combined effect of random errors on the waveplate's retardation error(Δδ)
    Fig. 6. The influence of the combined effect of random errors on the waveplate's retardation error(Δδ
    Simulation of nonlinear fitting of Waveplate's Parameters(τIin,N,θ2initial)
    Fig. 7. Simulation of nonlinear fitting of Waveplate's Parameters(τIinNθ2initial
    Comparison of light intensity before and after the nonlinear effect correction of the detector
    Fig. 8. Comparison of light intensity before and after the nonlinear effect correction of the detector
    The nonlinear least squares fitting results of light intensity as a function of the rotation angle of the 1/4λ waveplate
    Fig. 9. The nonlinear least squares fitting results of light intensity as a function of the rotation angle of the 1/4λ waveplate
    The nonlinear fitting results of measurement data of 5 groups 1/4λ waveplate
    Fig. 10. The nonlinear fitting results of measurement data of 5 groups 1/4λ waveplate
    The results of the first light intensity method to measure the retardation of 1/4λ and 0.356λ waveplates
    Fig. 11. The results of the first light intensity method to measure the retardation of 1/4λ and 0.356λ waveplates
    The results of the second light intensity method to measure the retardation of 1/4λ and 0.356λ waveplates
    Fig. 12. The results of the second light intensity method to measure the retardation of 1/4λ and 0.356λ waveplates
    Spectral data of white light dispersed at 630 nm~636 nm by spectrometer
    Fig. 13. Spectral data of white light dispersed at 630 nm~636 nm by spectrometer
    Nonlinear least squares fitting of the gray value of the 1/2λ waveplate to wavelength λ
    Fig. 14. Nonlinear least squares fitting of the gray value of the 1/2λ waveplate to wavelength λ
    The nonlinear fitting results of spectral data of 5 groups 1/2λ waveplate
    Fig. 15. The nonlinear fitting results of spectral data of 5 groups 1/2λ waveplate
    SampleItemδθ2¯initial
    90° waveplate

    Average of 5 measurements

    Maximum of 5 measurements

    Minimum of 5 measurements

    Standard deviation of 5 measurements

    90.83°

    90.93°

    90.79°

    0.06°

    -18.9°

    -18.4°

    -19.4°

    0.4°

    128.16° waveplate

    Average of 5 measurements

    Maximum of 5 measurements

    Minimum of 5 measurements

    Standard deviation of 5 measurements

    128.09°

    128.19°

    128.05°

    0.05°

    -26.95°

    -26.94°

    -26.97°

    0.01°

    180° waveplate

    Average of 5 measurements

    Maximum of 5 measurements

    Minimum of 5 measurements

    Standard deviation of 5 measurements

    181.2°

    182.3°

    180.4°

    0.7°

    -44.87°

    -44.84°

    -44.89°

    0.02°

    Table 1. Nonlinear fitting results of 1/4λ waveplate,0.356λ waveplate and 1/2λ waveplate
    SampleItemδ¯RMS
    90° waveplateTraditional measurement method 1 of light intensity92.26°0.96°
    Traditional measurement method 2 of light intensity91.75°0.82°
    Fitting light intensity method in the paper90.83°0.06°
    128.16° waveplateTraditional measurement method 1 of light intensity130.28°0.98°
    Traditional measurement method 2 of light intensity129.22°0.75°
    Fitting light intensity method in the paper128.09°0.05°
    Table 2. Comparison of the results of three measurement methods for the retardation of 1/4λ waveplate and 0.356λ waveplate
    Fan WAN, Yue ZHONG, Zhongquan QU, Zhi XU, Hui ZHANG, Yang PENG. High-precision Measurement Methods Research of Phase Retardance of Waveplates at 0°~360°[J]. Acta Photonica Sinica, 2023, 52(5): 0552215
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