Radiation characteristic measurement of low temperature plasma under atmospheric pressure

[in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 34 >Issue 1 >Page 41 > Article

Opto-Electronic Engineering
Vol. 34, Issue 1, 41 (2007)

Radiation characteristic measurement of low temperature plasma under atmospheric pressure

[in Chinese] and [in Chinese]

Author Affiliations

[in Chinese]

show less

DOI: Cite this Article

[in Chinese], [in Chinese]. Radiation characteristic measurement of low temperature plasma under atmospheric pressure[J]. Opto-Electronic Engineering, 2007, 34(1): 41 Copy Citation Text

show less

Abstract

[in Chinese], [in Chinese]. Radiation characteristic measurement of low temperature plasma under atmospheric pressure[J]. Opto-Electronic Engineering, 2007, 34(1): 41

Download Citation

Tools

Save the article for my favorites

Paper Information