• Acta Photonica Sinica
  • Vol. 51, Issue 9, 0912001 (2022)
Yifeng SUN*, Zhishan GAO, Xiaoxin FAN, Jiale ZHANG, Jianqiu MA, and Qun YUAN
Author Affiliations
  • School of Electronic and Optical Engineering,Nanjing University of Science and Technology,Nanjing 210094,China
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    DOI: 10.3788/gzxb20225109.0912001 Cite this Article
    Yifeng SUN, Zhishan GAO, Xiaoxin FAN, Jiale ZHANG, Jianqiu MA, Qun YUAN. Signal Processing for Height Measurement of High-aspect-ratio Structure Based on Low-coherence Interferometry[J]. Acta Photonica Sinica, 2022, 51(9): 0912001 Copy Citation Text show less
    System of Linnik-type low-coherence scanning interferometry
    Fig. 1. System of Linnik-type low-coherence scanning interferometry
    Structural parameters of the measurement sample and the location of the sampling point
    Fig. 2. Structural parameters of the measurement sample and the location of the sampling point
    Original coherence signals of eight sampling points in Fig. 2
    Fig. 3. Original coherence signals of eight sampling points in Fig. 2
    Results of CEEMDAN
    Fig. 4. Results of CEEMDAN
    Pre-processed coherence signals of eight sampling points in Fig. 2 (The dotted line is the signal envelope)
    Fig. 5. Pre-processed coherence signals of eight sampling points in Fig. 2 (The dotted line is the signal envelope)
    Flow of the proposed algorithm
    Fig. 6. Flow of the proposed algorithm
    Binarization result combining contrast and intensity information
    Fig. 7. Binarization result combining contrast and intensity information
    Measurement result of the high-aspect-ratio trench
    Fig. 8. Measurement result of the high-aspect-ratio trench
    Number12345678910
    Result/μm101.235101.003101.587101.296101.198100.458101.263101.212100.834100.846
    Mean value/μm101.093
    Standard deviation/μm0.316
    Absolute error/μm0.677
    Relative error/%0.67%
    Table 1. Measurement result of the high-aspect-ratio trench
    Yifeng SUN, Zhishan GAO, Xiaoxin FAN, Jiale ZHANG, Jianqiu MA, Qun YUAN. Signal Processing for Height Measurement of High-aspect-ratio Structure Based on Low-coherence Interferometry[J]. Acta Photonica Sinica, 2022, 51(9): 0912001
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