• Optics and Precision Engineering
  • Vol. 18, Issue 3, 677 (2010)
ZHANG Ning1,2,*, SHEN Xiang-heng1, and YANG Liang1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    ZHANG Ning, SHEN Xiang-heng, YANG Liang. Evaluation of tracking performance of photoelectric theodolite using equivalent model of tracking error[J]. Optics and Precision Engineering, 2010, 18(3): 677 Copy Citation Text show less
    References

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    [2] WANG J L.Study on TV tracking system of O-E theodolite to track and acquire fast moving targets[D].Changchun:Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences.2002.(in Chinese)

    [3] LI W J,CHEN T.Analysis and restraining of random noise of optoelectronic tracking system[J].Opt.Precision Eng.,2007,15(2):254-260.(in Chinese)

    [4] WU J P.System Identification [M].Beijing: China Railway Publish House, 1994:168-170.(in Chinese)

    [5] FANG CH ZH,XIAO D Y.Process Identification[M].Beijing: Tsinghua University Press,2007:134-137.(in Chinese)

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    [8] ZHANG B,HE G X,SHEN X H.Calibration of programmable dynamic target [J].Opt.Precision Eng.,2003,11(2):176-180.(in Chinese)

    [9] ZHANG N, SHEN X H.Modeling of linear dynamic target based on equivalent sine curve and equivalent target[J].Laser & Infrared,2008,38(2):154-157.(in Chinese)

    [10] MENG ZH, ZHNAG T, ZHENG X J, et al..Application of real time polynomial fitting based on orthogonal basis function algorithm to encoder rate measurement[J].Opt.Precision Eng.,2006,14(2):303-307.(in Chinese)

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    CLP Journals

    [1] LI Miao, GAO Hui-bin. Modeling for tracking error of theodolite based on RBF neural network[J]. Optics and Precision Engineering, 2012, 20(4): 818

    [2] FENG Dong-yan, GAO Yun-guo, ZHANG Wen-bao. Elimination of shafting errors in photoelectrical theodolites with standard-bearings[J]. Optics and Precision Engineering, 2011, 19(3): 605

    ZHANG Ning, SHEN Xiang-heng, YANG Liang. Evaluation of tracking performance of photoelectric theodolite using equivalent model of tracking error[J]. Optics and Precision Engineering, 2010, 18(3): 677
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