• Chinese Optics Letters
  • Vol. 5, Issue s1, 237 (2007)
Chu-Shik Kang, Jae Wan Kim, Jong-Ahn Kim, Ho Suhng Suh, and Won-Kyu Lee
Author Affiliations
  • Length/Time Metrology Group, Physical Metrology Division, Korea Research Institute of Standards and Science, Daejeon 305-340, Korea
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    Chu-Shik Kang, Jae Wan Kim, Jong-Ahn Kim, Ho Suhng Suh, Won-Kyu Lee. Optical gauge block metrology in KRISS[J]. Chinese Optics Letters, 2007, 5(s1): 237 Copy Citation Text show less

    Abstract

    Gauge block measurement by using optical interferometry in Korea Research Institute of Standards and Science (KRISS) is described. A partially modified commercial Twyman-Green type gauge block interferometer equipped with three frequency stabilized lasers which are coupled into one single mode optical fiber, is used for the measurement of gauge blocks of nominal length up to 250 mm. Fringe scanning Fourier transform method is used to obtain the excess fraction value from the interference fringes. The temperature inside the interferometer is stabilized within +-4 mK for three hours. The standard uncertainty (k=1) of measurement is 29 nm for a 250-mm gauge block.
    Chu-Shik Kang, Jae Wan Kim, Jong-Ahn Kim, Ho Suhng Suh, Won-Kyu Lee. Optical gauge block metrology in KRISS[J]. Chinese Optics Letters, 2007, 5(s1): 237
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