• Journal of Applied Optics
  • Vol. 45, Issue 4, 685 (2024)
Xiaoyang YANG1,*, Manling SHEN2, Dahui WANG2, Pengling YANG2, and Xiangyang LI1
Author Affiliations
  • 1Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2Institute of Northwest Nuclear Technology, Xi'an 710024, China
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    DOI: 10.5768/JAO202445.0401003 Cite this Article
    Xiaoyang YANG, Manling SHEN, Dahui WANG, Pengling YANG, Xiangyang LI. Mid-infrared trap detector technology based on cryogenic integrating sphere[J]. Journal of Applied Optics, 2024, 45(4): 685 Copy Citation Text show less
    Schematic diagram of cryogenic mid-infrared trap detector
    Fig. 1. Schematic diagram of cryogenic mid-infrared trap detector
    Structure and principle of integrating sphere
    Fig. 2. Structure and principle of integrating sphere
    Schematic diagram of micro integrating sphere structure
    Fig. 3. Schematic diagram of micro integrating sphere structure
    Photos of experimental samples
    Fig. 4. Photos of experimental samples
    SRI 1000 hand-held emissivity measuring instrument
    Fig. 5. SRI 1000 hand-held emissivity measuring instrument
    Schematic diagram of test for specific wavelength reflection characteristics
    Fig. 6. Schematic diagram of test for specific wavelength reflection characteristics
    Schematic diagram of diffuse reflection coordinate system
    Fig. 7. Schematic diagram of diffuse reflection coordinate system
    Reflet 180S BRDF test system
    Fig. 8. Reflet 180S BRDF test system
    Variation curves of reflected radiation intensity with test angles
    Fig. 9. Variation curves of reflected radiation intensity with test angles
    Near infrared BRDF curves of different samples
    Fig. 10. Near infrared BRDF curves of different samples
    Photos of samples used for surface testing
    Fig. 11. Photos of samples used for surface testing
    Photos of surface morphology
    Fig. 12. Photos of surface morphology
    Pseudo-color diagram of sample surface height
    Fig. 13. Pseudo-color diagram of sample surface height
    Vertical profile curves of sample surface
    Fig. 14. Vertical profile curves of sample surface
    Scanning electron microscope image
    Fig. 15. Scanning electron microscope image
    Diagram of produced integrating sphere
    Fig. 16. Diagram of produced integrating sphere
    Variation curve of light intensity attenuation ratio of integrating sphere with reflectivity of inner cavity wall
    Fig. 17. Variation curve of light intensity attenuation ratio of integrating sphere with reflectivity of inner cavity wall
    Spectral response curves of detector chip before and after integrating sphere installation
    Fig. 18. Spectral response curves of detector chip before and after integrating sphere installation
    Schematic block diagram of infrared detector test system
    Fig. 19. Schematic block diagram of infrared detector test system
    样品编号宽光谱(3 μm~35 μm)反射率
    1#0.11
    2#0.95
    3#0.19
    4#0.91
    5#0.91
    Table 1. Test results of wide spectrum reflectance of samples
    样品编号光强比值(@3 800 nm)光强比值(@1 064 nm)
    1#0.003 50.029 7
    2#0.020 00.036 9
    3#0.012 00.029 4
    4#0.032 00.045 7
    5#0.029 00.042 3
    Table 2. Test results of relative reflectivity of samples
    测试状态光电信号/A器件噪声/A·Hz1/2
    中波芯片1.93×10−73.5×10−12
    带积分球中波芯片1.30×10−81.0×10−12
    Table 3. Electrical performance of detector chip before and after integrating sphere installation
    Xiaoyang YANG, Manling SHEN, Dahui WANG, Pengling YANG, Xiangyang LI. Mid-infrared trap detector technology based on cryogenic integrating sphere[J]. Journal of Applied Optics, 2024, 45(4): 685
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