Analysis and Test on Rotation Error Induced by the Micro-displacement of Phase-shifter

Wu Xuhua; Chen Lei; Yan Jiajun

Journals >Acta Photonica Sinica >Volume 35 >Issue 6 >Page 919 > Article

Acta Photonica Sinica
Vol. 35, Issue 6, 919 (2006)

Analysis and Test on Rotation Error Induced by the Micro-displacement of Phase-shifter

Wu Xuhua^*, Chen Lei, and Yan Jiajun

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[in Chinese]

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Wu Xuhua, Chen Lei, Yan Jiajun. Analysis and Test on Rotation Error Induced by the Micro-displacement of Phase-shifter[J]. Acta Photonica Sinica, 2006, 35(6): 919 Copy Citation Text

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References

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[4] Wu D. [Ph. D. dissertation.],Nanjing: Nanjing University of Science & Technology,2005.1

[5] Tang S. Self-calibrating five-frame algorithm for phase shifting interferometry. Proc SPIE,1996,2860:91～98

[6] Yan J J. [Ph. M. dissertation.],Nanjing: Nanjing University of Science & Technology,2004.1

[7] Malacara D,Servin M,Malacara Z. Interferogram Analysis for Optical Testing. New York: Marcel Dekker,1998.337～354

[8] Han G S,Kim S W. Numerical correction of reference phases in phase-shifting interferometry by iterative least-squares fitting. ApplOpt,1994,33(3):732～7325

Wu Xuhua, Chen Lei, Yan Jiajun. Analysis and Test on Rotation Error Induced by the Micro-displacement of Phase-shifter[J]. Acta Photonica Sinica, 2006, 35(6): 919

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