• Chinese Optics Letters
  • Vol. 2, Issue 9, 09552 (2004)
Tingdi Liao1、2、*, Yishen Qiu1、2, and Huizhen Xu1、2
Author Affiliations
  • 1School of Physics &
  • 2Optoelectronics Technology, Fujian Normal University, Fuzhou 350007
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    Tingdi Liao, Yishen Qiu, Huizhen Xu. An optical method for wavelength fine-selection in optical spectrum analysers[J]. Chinese Optics Letters, 2004, 2(9): 09552 Copy Citation Text show less
    References

    [1] G. Levesque (EXFO), Photonics Spectra 34, 106 (2000).

    [2] S. V. Kartalopoulos, DWDM: Networks, Devices, and Technology (Wiley-IEEE Press, 2002).

    [3] K. R. Wildnauer and Z. Azary, Hewlett-Packard Journal 44, 68 (1993).

    [4] Yokogawa Electronic Corporation (Japan), "Optical spectrum analyser and spectroscope" International Patent Number WO9628713A1 (1996).

    [5] Oxford Fibre Optics Tools Ltd. (UK), "Optical spectrum analyser" International Patent Application Number PCT/GB00/00496 (1999).

    [6] T. D. Liao and R. Chaney, "Wavelength tuning in external cavity lasers" International Patent WO 01/73905 (October 4, 2001).

    Tingdi Liao, Yishen Qiu, Huizhen Xu. An optical method for wavelength fine-selection in optical spectrum analysers[J]. Chinese Optics Letters, 2004, 2(9): 09552
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