• Chinese Optics Letters
  • Vol. 22, Issue 6, 061202 (2024)
Qiao Sun1,2,3, Nianxi Xu1,2, Haigui Yang1,2,3, Dongzhi Shan1,2..., Yang Tang1,2, Xin Chen1,2, Tongtong Wang1,2,*, Jinsong Gao4 and Yu Cai5|Show fewer author(s)
Author Affiliations
  • 1Key Laboratory of Optical System Advanced Manufacturing Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
  • 2State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
  • 3University of Chinese Academy of Sciences, Beijing 100049, China
  • 4Jilin Provincial Key Laboratory of Advanced Optoelectronic Equipment and Instrument Manufacturing Technology, Changchun 130033, China
  • 5Unit 96951 of the People’s Liberation Army, Beijing 100039, China
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    DOI: 10.3788/COL202422.061202 Cite this Article Set citation alerts
    Qiao Sun, Nianxi Xu, Haigui Yang, Dongzhi Shan, Yang Tang, Xin Chen, Tongtong Wang, Jinsong Gao, Yu Cai, "Highly efficient optics/microwave beam splitter based on frequency selective surface," Chin. Opt. Lett. 22, 061202 (2024) Copy Citation Text show less
    Schematic diagram of the FSS-based optics/microwave beam splitter.
    Fig. 1. Schematic diagram of the FSS-based optics/microwave beam splitter.
    Schematic diagram illustrating multiple-beam interference. (a) The reflections and refractions of the multiple-beam in the substrate. (b) The simulation transmittance curve of the substrate under oblique incidence angle of 45°.
    Fig. 2. Schematic diagram illustrating multiple-beam interference. (a) The reflections and refractions of the multiple-beam in the substrate. (b) The simulation transmittance curve of the substrate under oblique incidence angle of 45°.
    Equivalent circuit model diagram of the beam splitter. (a) The beam splitter substrate Model a. (b) The equivalent circuit model corresponding to Model a. (c) The multi-layer bonding beam splitter Model c. (d) The equivalent circuit model corresponding to Model c. (e) The beam splitter Model e with the FSS structure. (f) The equivalent circuit model corresponding to Model e.
    Fig. 3. Equivalent circuit model diagram of the beam splitter. (a) The beam splitter substrate Model a. (b) The equivalent circuit model corresponding to Model a. (c) The multi-layer bonding beam splitter Model c. (d) The equivalent circuit model corresponding to Model c. (e) The beam splitter Model e with the FSS structure. (f) The equivalent circuit model corresponding to Model e.
    Design results of the optics/microwave beam splitter. (a) The structural parameters of the FSS added onto the interface. (b) The resonance current distribution of the FSS. (c) The simulation results of the TE polarization transmittance in the Ka band for three beam splitter models. (d) The simulation results of the TE polarization transmittance in the microwave frequency band for three beam splitter models.
    Fig. 4. Design results of the optics/microwave beam splitter. (a) The structural parameters of the FSS added onto the interface. (b) The resonance current distribution of the FSS. (c) The simulation results of the TE polarization transmittance in the Ka band for three beam splitter models. (d) The simulation results of the TE polarization transmittance in the microwave frequency band for three beam splitter models.
    Schematic diagram of the optics/microwave beam splitter sample.
    Fig. 5. Schematic diagram of the optics/microwave beam splitter sample.
    (a) Fabricated optics/microwave beam splitter prototype. (b) The microwave measurement setup.
    Fig. 6. (a) Fabricated optics/microwave beam splitter prototype. (b) The microwave measurement setup.
    (a) The 450–900 nm reflectance measurement result of the sample. (b) The 7.7–10.5 µm reflectance measurement result of the sample. (c) The Ka band transmittance measurement result of the sample and the comparison with the simulation. (d) The microwave working frequency band transmittance measurement result of the sample and the comparison with the simulation.
    Fig. 7. (a) The 450–900 nm reflectance measurement result of the sample. (b) The 7.7–10.5 µm reflectance measurement result of the sample. (c) The Ka band transmittance measurement result of the sample and the comparison with the simulation. (d) The microwave working frequency band transmittance measurement result of the sample and the comparison with the simulation.
    Qiao Sun, Nianxi Xu, Haigui Yang, Dongzhi Shan, Yang Tang, Xin Chen, Tongtong Wang, Jinsong Gao, Yu Cai, "Highly efficient optics/microwave beam splitter based on frequency selective surface," Chin. Opt. Lett. 22, 061202 (2024)
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