Selection of Scattering Points for Obtaining Fretting Characteristics of Ballistic Missile

[in Chinese]; [in Chinese]; [in Chinese]

doi:10.3969/j.issn.1671-637x.2017.11.001

Journals >Electronics Optics & Control >Volume 24 >Issue 11 >Page 1 > Article

Electronics Optics & Control
Vol. 24, Issue 11, 1 (2017)

Selection of Scattering Points for Obtaining Fretting Characteristics of Ballistic Missile

[in Chinese]^1、2, [in Chinese]¹, and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

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DOI: 10.3969/j.issn.1671-637x.2017.11.001 Cite this Article

[in Chinese], [in Chinese], [in Chinese]. Selection of Scattering Points for Obtaining Fretting Characteristics of Ballistic Missile[J]. Electronics Optics & Control, 2017, 24(11): 1 Copy Citation Text

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References

[3] HU X W,TONG N N,HU G P,et al.Multi-ballistic targets resolution based on micro-Doppler[J］.Systems Engineering and Electronics,2015,37(8):1734-1740.

[4] LI P,WANG D C,WANG L.Separation of micro-Doppler signals based on time frequency filter and Viterbi algorithm[J］.Signal,Image and Video Processing,2013,7(3):593-605.

[11] CHEN V C,LING H.Time-frequency transforms for radar imaging and signal analysis[M］.Boston:Artech House,2002.

[in Chinese], [in Chinese], [in Chinese]. Selection of Scattering Points for Obtaining Fretting Characteristics of Ballistic Missile[J]. Electronics Optics & Control, 2017, 24(11): 1

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