La 0.5Sr 0.5CoO 3(LSCO)thin films were deposited on Si substrate by metalorganic chemical liquid deposition (MOCLD). PbZr 0.5Ti 0.5O 3(PZT)were deposited on LSCO thin films by sol-gel process. X-ray diffraction investigation shows that PZT/LSCO multilayer thin films are polycrystalline with preperential (110)-orientation and contain perovskite phase only. The grain diameter of PZT was estimated to be about 50～80nm by Scherrer's equation. Atomic force microscopy measurement shows that the films have smooth surface with RMS<5nm. Raman spectrum was used to study the structural property of PZT/LSCO thin films. The optical properties of the films were measured by spectroscopic ellipsometry in the wavelength range of 400～1700nm. Lorentz model was used to express the optical properties of PZT and LSCO thin films. Optical constants (refractive index n and extinction coefficient k) of the PZT and LSCO films were obtained.