Nondestructive determination for the thickness of spin-coated polymer films by transparent coefficient

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Chinese Optics Letters >Volume 3 >Issue 0s >Page 290 > Article

Chinese Optics Letters
Vol. 3, Issue 0s, 290 (2005)

Nondestructive determination for the thickness of spin-coated polymer films by transparent coefficient

[in Chinese]^1、2, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, and [in Chinese]¹

Author Affiliations

¹Adavnced Photonics Center, Southeast University, Nanjing 210096

²Department of Electronics and Information, Huaiyin Institute of Technology, Huaian 223001

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Nondestructive determination for the thickness of spin-coated polymer films by transparent coefficient[J]. Chinese Optics Letters, 2005, 3(0s): 290 Copy Citation Text

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References

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[2] H. Sirringhaus, N. Tessler, and R. H. RFriend, Science, 280, 1741 (1998).

[3] Y. Acao, I. D. Parker, G. Yu, C. Zhang, and A. J. Heeger, Nature 397, 414 (1999).

[4] Z. Zhong, C. Liu, S. Yin, and C. Xu, J. Huazhong Univ. Sci. Technol. (Nature Science Edition) 31, 37 (2003).

[5] Z. Gu, G. Wang, P. Liang, and L. Hou, Chin. J. Lasers (in Chinese) 26, 902 (1999).

[6] I.-T. Im, K.-S. Kim, and J. K. Cho, in Proceedings of Intel Symposium on Electronic Materials and Packaging 2001 (2001).

[7] X. Liu, Q. Shen, Z. Cao, and Y. Chen, Acta Opt. Sin. (in Chinese) 20, 991 (2000).

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