• Chinese Optics Letters
  • Vol. 8, Issue s1, 170 (2010)
Songwen Deng1、2, Hongji Qi1, Chaoyang Wei1, Kui Yi1, Zhengxiu Fan1, and Jianda Shao1
Author Affiliations
  • 1Optical Films Technology R &
  • 2D Center, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
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    DOI: 10.3788/COL201008s1.0170 Cite this Article Set citation alerts
    Songwen Deng, Hongji Qi, Chaoyang Wei, Kui Yi, Zhengxiu Fan, Jianda Shao. Determination of fine layer structure in Ni/C multilayer using soft X-ray resonant reflectivity[J]. Chinese Optics Letters, 2010, 8(s1): 170 Copy Citation Text show less
    References

    [1] B. J. MacGowan, S. Maxon, P. L. Hagelstein, C. J. Keane, R. A. London, D. L. Matthews, M. D. Rosen, J. H. Scofield, and D. A. Whelan, Phys. Rev. Lett. 59, 2157 (1987).

    [2] H. Daido, Y. Kato, K. Murai, S. Ninomiya, R. Kodama, G. Yuan, Y. Oshikane, M. Takagi, H. Takabe, and F. Koike, Phys. Rev. Lett. 75, 1074 (1995).

    [3] H. Daido, S. Ninomiya, T. Imani, R. Kodama, M. Takagi, Y. Kato, K. Murai, J. Zhang , Y. You, and Y. Gu, Opt. Lett. 21, 958 (1996).

    [4] J. Nilsen, Phys. Rev. Lett. 66, 305 (1991).

    [5] F. Schafers, Phys. B 283, 119 (2000).

    [6] S. S. Andreev, H. C. Mertins, Y. Y. Platonov, N. N. Salashchenko, F. Schaefers, E. A. Shamov, and L. A. Shmaenok, Nucl. Intrum. Meth. Phys. Res. A 448, 133 (2000).

    [7] M. H. Modi, G. S. Lodha, M. Nayak, A. K. Sinha, and

    [8] R. V. Nandekar, Phys. B 325, 280 (2003).

    [9] H. Maury, P. Jonnard, J. M. Andre, J. Gautier, M. Roulliay, F. Bridou , F. Delmotte, M. Ravet, A. Jerome, and P. Holliger, Thin Solid Films 514, 278 (2006).

    [10] M. Nayak, G. S. Lodha, R. V. Nandedkar, S. M. Chaudhari, and P. Bhatt, J. Electron. Spectro. Relat. Phenom. 152, 115 (2006).

    [11] M. J. H. Kessels, F. Bijkerk, F. D. Tichelaar, and J. Verhoeven J. Appl. Phys. 97, 093513 (2005).

    [12] L. G. Parratt, Phys. Rev. 95, 359 (1954).

    [13] B. L. Henke, E. M. Gullikson, and J. C. Davis, Atomic Data and Nuclear Data Table 54, 181 (1993).

    [14] M. Nayak, G. S. Lodha, A. K. Sinha, and R. V. Nandedar, Appl. Phys. Lett. 89, 181920 (2006).

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    [2] Gao Hongfang, Ren Yuxuan, Liu Weiwei, Li Yinmei. Rotation Dynamics of Yeast Cell in Vortex Optical Tweezers[J]. Chinese Journal of Lasers, 2011, 38(4): 404002

    Data from CrossRef

    [1] Maheswar Nayak, G. S. Lodha. Chemical selective microstructural analysis of thin film using resonant x-ray reflectivity. Journal of Applied Physics, 114, 023505(2013).

    Songwen Deng, Hongji Qi, Chaoyang Wei, Kui Yi, Zhengxiu Fan, Jianda Shao. Determination of fine layer structure in Ni/C multilayer using soft X-ray resonant reflectivity[J]. Chinese Optics Letters, 2010, 8(s1): 170
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