[1] JIN W Q, CAO Y, LIU CH L, et al.. Uncooled infrared focal plane array detector module with the self-adaptive non-uniformity correction function［J］. Journal of Applied Optics, 2009, 30(2):348-352. (in Chinese)

[2] CHEN R, TAN X Q. Study on non-uniformity correction of infrared image［J］. Infrared Technology, 2002, 24(1):1-3. (in Chinese)

[3] DAI SH SH, ZHANG X L. Real-time nonuniformity correction of infrared focal plane arrays by system on programmable chip［J］. Opt. Precision Eng., 2009, 17(4):854-858. (in Chinese)

[4] XU T H, ZHAO Y G. Analysis of scene-based techniques for nonuniformity correction of infrared focal plane array［J］. J. Infrared Millim. Wave, 2004, 23(4):257-261. (in Chinese)

[5] SUI J, JIN W Q, DONG L Q, et al.. A scene-based nonuniformity correction algorithm for scanning-type infrared camera［J］. Chinese Journal of Electronics, 2007, 16(2):281-284.

[6] SUI J, JIN W Q, DONG L Q. A new solution for correcting nonuniformity of scanning-type infrared sensors［C］. ICIS’06, 2006:645-648.

[7] SUI J, JIN W Q, DONG L Q, et al.. A new nonuniformity correction algorithm for infrared line scanners［J］. SPIE, 2006, 6207: 62070Y.

[8] LIU Y J, ZHU H, ZHAO Y G. Nonuniformity correction algorithm based on infrared focal plane array readout architecture［J］. Opt. Precision Eng., 2008, 16(1):128-133. (in Chinese)

[9] DAI SH SH, ZHANG T Q. Adaptive nonuniformity correction algorithm for IRFPA with nonlinear response［J］. Opt. Precision Eng., 2008, 16(4):714-719. (in Chinese)

[10] ZHANG W, NIE H B, HOU Q Y, et al.. Variable-step constant statistics algorithm for removing residual fixed pattern noise of infrared images as second non-uniformity correction［J］. SPIE, 2009, 7513:751328.

[11] Country Engineering Supervision Bureau. The technical norms for measurement and test of characteristic parameters of infrared focal plane arrays. GB/T 17444-1998［ M ］. Beijing: Standards Press of China, 1998. (in Chinese)

[12] ZHENG F X. An improved algorithm for adaptive nonuniformity correction［J］. Science Technology and Engineering, 2010, 10(12):2984-2986. (in Chinese)