Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Acta Photonica Sinica >Volume 44 >Issue 12 >Page 1227002 > Article
    • Acta Photonica Sinica
    • Vol. 44, Issue 12, 1227002 (2015)
    The Transmission of Polarized Light of Space Attitude in Quantum Communication
    YANG Hai-ma1、2、3、*, MA Cai-wen2, WANG Jian-yu4, ZHANG Liang4, LIU Jin1, and HUAN Yuan-shen1
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
    • show less
    DOI: 10.3788/gzxb20154412.1227002 Cite this Article
    YANG Hai-ma, MA Cai-wen, WANG Jian-yu, ZHANG Liang, LIU Jin, HUAN Yuan-shen. The Transmission of Polarized Light of Space Attitude in Quantum Communication[J]. Acta Photonica Sinica, 2015, 44(12): 1227002 Copy Citation Text show less
    References

    CLP Journals

    [1] ZHANG Wen-jing, ZHANG Zhi-wei, SUN Yun-qiang, ZHU Xiang, DENG Nan, ZHANG Cai-feng, GUO Peng-cheng, LI Qing-sheng. Polarization Display and Measurement Experiment of Elliptically Polarized Beam[J]. Acta Photonica Sinica, 2017, 46(5): 526003

    Abstract
    Get PDF
    Figures&Tables (0)
    Equations (0)
    References (0)
    Get Citation
    Copy Citation Text
    YANG Hai-ma, MA Cai-wen, WANG Jian-yu, ZHANG Liang, LIU Jin, HUAN Yuan-shen. The Transmission of Polarized Light of Space Attitude in Quantum Communication[J]. Acta Photonica Sinica, 2015, 44(12): 1227002
    Download Citation
    Tools
    Share
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology