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    Journals >Chinese Journal of Lasers >Volume 17 >Issue 2 >Page 111 > Article
    • Chinese Journal of Lasers
    • Vol. 17, Issue 2, 111 (1990)
    Laser-induced mark formation on phase change thin film
    [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Laser-induced mark formation on phase change thin film[J]. Chinese Journal of Lasers, 1990, 17(2): 111 Copy Citation Text show less

    Abstract

    Based upon TEM analysis, phase change storage mechanism of TeSeln thin film has been studied in detail and a model for writing and erasing process is proposed.

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    [in Chinese], [in Chinese], [in Chinese]. Laser-induced mark formation on phase change thin film[J]. Chinese Journal of Lasers, 1990, 17(2): 111
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    Paper Information
    Recommended Topics
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