Transmission enhancement is simulated verification based on a non-hollowing double layer of metamaterial filter. The proposed structure contains a continuous metallic film covering on a continuous dielectric layer. The simulated transmission is enhanced obviously comparing the single metal layer structure. Effects of the dielectric layer thickness and the incident angle on the transmission enhancement are simulated verification. It is found that the maximized transmittance enhancement is achieved when the thickness h1 is 20nm. Moreover, the proposed compact metal-dielectric double-layered films shows a stability of transmittance enhancement when the incident angle reaches to 45°, which can be applied in many potential fields due to its non-hollowing design strategy.