• High Power Laser and Particle Beams
  • Vol. 33, Issue 11, 116001 (2021)
Ze He, Ning Huang*, Peng Wang, Zihan Cheng, and Bo Peng
Author Affiliations
  • Key Laboratory of Radiation Physics and Technology of the Ministry of Education, Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064, China
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    DOI: 10.11884/HPLPB202133.210299 Cite this Article
    Ze He, Ning Huang, Peng Wang, Zihan Cheng, Bo Peng. Simulation study of full-field X-ray fluorescence imaging with a pinhole camera[J]. High Power Laser and Particle Beams, 2021, 33(11): 116001 Copy Citation Text show less
    The principle of FF-XRF imaging based on pinhole
    Fig. 1. The principle of FF-XRF imaging based on pinhole
    The mean free path of different materials in the range of 1-30 keV
    Fig. 2. The mean free path of different materials in the range of 1-30 keV
    Sharpness and isoplanatism of PSF
    Fig. 3. Sharpness and isoplanatism of PSF
    Six different pinhole mask structures
    Fig. 4. Six different pinhole mask structures
    PSF with different aperture types at the pinhole diameter of 50 μm, 100 μm, 200 μm and 400 μm
    Fig. 5. PSF with different aperture types at the pinhole diameter of 50 μm, 100 μm, 200 μm and 400 μm
    MTF with different aperture types at the pinhole diameter of 50 μm, 100 μm, 200 μm and 400 μm
    Fig. 6. MTF with different aperture types at the pinhole diameter of 50 μm, 100 μm, 200 μm and 400 μm
    Images of the original plane source and the PSF of different energy
    Fig. 7. Images of the original plane source and the PSF of different energy
    Energy spectra of four characteristic X-rays
    Fig. 8. Energy spectra of four characteristic X-rays
    The pattern composed of different characteristic X-rays
    Fig. 9. The pattern composed of different characteristic X-rays
    Pattern composed of different characteristic X-rays after image processing
    Fig. 10. Pattern composed of different characteristic X-rays after image processing
    diameter/μmpinhole mask structuresleft sharpness/μmright sharpness/μmisoplanatism/μm
    50(a) straight hole model656598
    (b) double cone hole model656564
    (c) double cone and straight hole model525264
    (d) right cone hole model656566
    (e) left cone hole model656566
    (f) penumbra hole model525266
    100(a) straight hole model6565200
    (b) double cone hole model7878100
    (c) double cone and straight hole model656597
    (d) right cone hole model787899
    (e) left cone hole model787899
    (f) penumbra hole model656597
    200(a) straight hole model7878399
    (b) double cone hole model7878205
    (c) double cone and straight hole model6565198
    (d) right cone hole model7878206
    (e) left cone hole model7878205
    (f) penumbra hole model6565198
    (a) straight hole model7878800
    (b) double cone hole model104104411
    400(c) double cone and straight hole model7878399
    (d) right cone hole model104104411
    (e) left cone hole model104104411
    (f) penumbra hole model7878398
    Table 1. Sharpness and isoplanatism of PSF with different pinhole mask structures at the pinhole diameter of 50 μm, 100 μm, 200 μm and 400 μm
    pinhole mask structurediameter/μm
    50100200400
    (a) straight hole model6.93.72.01.0
    (b) double cone hole model10.06.73.61.9
    (c) double cone and straight hole model10.16.93.72.0
    (d) right cone hole model10.16.83.61.9
    (e) left cone hole model10.16.83.61.9
    (f) penumbra hole model10.26.93.72.0
    Table 2. Cut-off frequency (lp/mm) of MTF with different pinhole mask structures at the pinhole diameter of 50 μm, 100 μm, 200 μm and 400 μm
    energy/keVstatistical error/%original SNR/dBprocessed SNR/dBiterations
    6.41.218.726.22
    8.00.818.226.94
    9.80.720.227.24
    12.61.218.826.84
    Table 3. The performance of image processing
    Ze He, Ning Huang, Peng Wang, Zihan Cheng, Bo Peng. Simulation study of full-field X-ray fluorescence imaging with a pinhole camera[J]. High Power Laser and Particle Beams, 2021, 33(11): 116001
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