Author Affiliations
Key Laboratory of Radiation Physics and Technology of the Ministry of Education, Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064, Chinashow less
Fig. 1. The principle of FF-XRF imaging based on pinhole
Fig. 2. The mean free path of different materials in the range of 1-30 keV
Fig. 3. Sharpness and isoplanatism of PSF
Fig. 4. Six different pinhole mask structures
Fig. 5. PSF with different aperture types at the pinhole diameter of 50 μm, 100 μm, 200 μm and 400 μm
Fig. 6. MTF with different aperture types at the pinhole diameter of 50 μm, 100 μm, 200 μm and 400 μm
Fig. 7. Images of the original plane source and the PSF of different energy
Fig. 8. Energy spectra of four characteristic X-rays
Fig. 9. The pattern composed of different characteristic X-rays
Fig. 10. Pattern composed of different characteristic X-rays after image processing
diameter/μm | pinhole mask structures | left sharpness/μm | right sharpness/μm | isoplanatism/μm | 50 | (a) straight hole model | 65 | 65 | 98 | (b) double cone hole model | 65 | 65 | 64 | (c) double cone and straight hole model | 52 | 52 | 64 | (d) right cone hole model | 65 | 65 | 66 | (e) left cone hole model | 65 | 65 | 66 | (f) penumbra hole model | 52 | 52 | 66 | 100 | (a) straight hole model | 65 | 65 | 200 | (b) double cone hole model | 78 | 78 | 100 | (c) double cone and straight hole model | 65 | 65 | 97 | (d) right cone hole model | 78 | 78 | 99 | (e) left cone hole model | 78 | 78 | 99 | (f) penumbra hole model | 65 | 65 | 97 | 200 | (a) straight hole model | 78 | 78 | 399 | (b) double cone hole model | 78 | 78 | 205 | (c) double cone and straight hole model | 65 | 65 | 198 | (d) right cone hole model | 78 | 78 | 206 | (e) left cone hole model | 78 | 78 | 205 | (f) penumbra hole model | 65 | 65 | 198 | | (a) straight hole model | 78 | 78 | 800 | | (b) double cone hole model | 104 | 104 | 411 | 400 | (c) double cone and straight hole model | 78 | 78 | 399 | | (d) right cone hole model | 104 | 104 | 411 | | (e) left cone hole model | 104 | 104 | 411 | | (f) penumbra hole model | 78 | 78 | 398 |
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Table 1. Sharpness and isoplanatism of PSF with different pinhole mask structures at the pinhole diameter of 50 μm, 100 μm, 200 μm and 400 μm
pinhole mask structure | diameter/μm | 50 | 100 | 200 | 400 | (a) straight hole model | 6.9 | 3.7 | 2.0 | 1.0 | (b) double cone hole model | 10.0 | 6.7 | 3.6 | 1.9 | (c) double cone and straight hole model | 10.1 | 6.9 | 3.7 | 2.0 | (d) right cone hole model | 10.1 | 6.8 | 3.6 | 1.9 | (e) left cone hole model | 10.1 | 6.8 | 3.6 | 1.9 | (f) penumbra hole model | 10.2 | 6.9 | 3.7 | 2.0 |
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Table 2. Cut-off frequency (lp/mm) of MTF with different pinhole mask structures at the pinhole diameter of 50 μm, 100 μm, 200 μm and 400 μm
energy/keV | statistical error/% | original SNR/dB | processed SNR/dB | iterations | 6.4 | 1.2 | 18.7 | 26.2 | 2 | 8.0 | 0.8 | 18.2 | 26.9 | 4 | 9.8 | 0.7 | 20.2 | 27.2 | 4 | 12.6 | 1.2 | 18.8 | 26.8 | 4 |
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Table 3. The performance of image processing