• Infrared Technology
  • Vol. 44, Issue 6, 628 (2022)
Qiyi WANG1、*, Likun XIA2, Bangze ZENG1, Deli ZHAO1, Youpan ZHU1, Ruotong CHEN1, Guang LI1, and Ruonan WANG1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    DOI: Cite this Article
    WANG Qiyi, XIA Likun, ZENG Bangze, ZHAO Deli, ZHU Youpan, CHEN Ruotong, LI Guang, WANG Ruonan. Research and Improvement on Reliability Growth of a Type of Infrared Thermal Imager[J]. Infrared Technology, 2022, 44(6): 628 Copy Citation Text show less
    References

    [4] Xavier Breniere, Philippe Tribolet. IR detectors life cycle cost and reliability optimization for tactical applications[C]//Conference on Electro-Optical and Infrared Systems: Technology and Applications III, 2006: 43-47(doi: 10.1117/12.690381).

    [5] Xavier Breniere, Alain Manissadjian, Vuillermet M, et al. Reliability optimization for IR detectors with compact cryo-coolers[C]//Proc. of SPIE, 2005: 187-198(doi: 10.1117/12.607591).

    [6] MOLINA Marianne, BRENIERE Xavier. IR detectors dewar and assemblies for stringent environmental conditions[C]//Proc. of SPIE, 2007: 80-85(doi: 10.1117/12.721647).

    WANG Qiyi, XIA Likun, ZENG Bangze, ZHAO Deli, ZHU Youpan, CHEN Ruotong, LI Guang, WANG Ruonan. Research and Improvement on Reliability Growth of a Type of Infrared Thermal Imager[J]. Infrared Technology, 2022, 44(6): 628
    Download Citation