[2] EIA/JEDEC Standard JESD51-1.Integrated Circuits Thermal Measurement Method - Electrical Test Method(Single Semiconductor Device).USA:ELECTRONIC INDUSTRIES ALLIANCE,1995.3~7
[2] EIA/JEDEC Standard JESD51-1.Integrated Circuits Thermal Measurement Method - Electrical Test Method(Single Semiconductor Device).USA:ELECTRONIC INDUSTRIES ALLIANCE,1995.3~7
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