• Optoelectronics Letters
  • Vol. 13, Issue 5, 335 (2017)
Chun-hua WEI1、2、*, Shu-hua YAN1、2, and Tian ZHANG2、3
Author Affiliations
  • 1Department of Instrument Science and Technology, College of Mechatronic Engineering and Automation, National University of Defense Technology, Changsha 410073, China
  • 2Interdisciplinary Center for Quantum Information, National University of Defense Technology, Changsha 410073,China
  • 3Xi’an Aerospace Huaxun Technology Co., LTD., Xi’an 710000, China
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    DOI: 10.1007/s11801-017-7092-8 Cite this Article
    WEI Chun-hua, YAN Shu-hua, ZHANG Tian. Compact diffraction grating laser wavemeter for cold atom experiments[J]. Optoelectronics Letters, 2017, 13(5): 335 Copy Citation Text show less

    Abstract

    We present an innovative and practical scheme of building a miniaturized wavemeter, with the advantages of low cost, high reliability and simple structure. Through a calibration test by a 780 nm external cavity diode laser (ECDL), the results show that our system gets a wavelength resolution of better than 1 pm, measurement accuracy of better than 2 pm (corresponding to a frequency of 1 GHz), and a measurement range of 8.5 nm. Finally, the multi-mode comparison test between our system and a commercial spectrum analyzer further indicates the high-precision, miniaturization and low cost of the proposed system, which shows that it is particularly suitable for ECDL and atom cooling and trapping experiments. The system design, experimental results and conclusions are of definite significance as a fine reference for other ranges of wavelength.
    WEI Chun-hua, YAN Shu-hua, ZHANG Tian. Compact diffraction grating laser wavemeter for cold atom experiments[J]. Optoelectronics Letters, 2017, 13(5): 335
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