[1] MATTHEWS D L, CAMPBELL E M, CEGLIO N M, et al.. Characterization of laser-produced plasma X-ray sources for use in X-ray radiograph [J]. J. Appl phys., 1983, 54(8):4260-4268.

[2] XIAO SH L, SHI J, LEI X M, et al.. Characteristics and application of elliptical curved LiF crystal analyzer [J]. Opt. Precision Eng., 2007,15(6):824-828. (in Chinese)

[3] QI L H, LI ZH F, NI Q L, et al.. Experimental study of the spectrum at 11-20 nm of a laser-produced plasma source using water target [J]. Opt. Precision Eng., 2005,13(3):272-275. (in Chinese)

[4] NI Q L. Technology for measuring spectrum from nanosecond laser plasma soft X-ray source [J]. Opt. Precision Eng., 2005,13(3):272-275. (in Chinese)

[5] WANG R R, WANG W, WANG CH, et al.. Spectral characterization of double-driven X-ray laser plasmas[J]. Acta Phys. Sin.,2003,52(3):556-560. (in Chinese)

[6] JANESICK J R , ELLIOT T , MARSH H H , et al.. Potential of CCDs for UV and X-ray diagnostics [J]. Rev. Sci. Instrum.,1985,56(5):796-801.

[7] GLFRICH J V, BROWN D B, BURKHALTER P G. Integral reflection coefficient of X-ray spectrometer crystals[J]. Appl Spectrosc,1975,29(4):322-326.

[8] HENKE B L,YAMADA H T,TANAKA T J. Pulsed plasma source spectrometry in the 80-8 000-ev X-ray region[J]. Rev. Sci. Instrum.,1983,54(10):1311-1330