Nondestructive testing of MCS dielectric defect based on A-Scan and C-Scan of Ultrasonic Test

HE Zhigang; LIANG Dongcheng; GONG Guohu; WANG Xiaomin

doi:10.11805/tkyda2019052

Journals >Journal of Terahertz Science and Electronic Information Technology >Volume 18 >Issue 5 >Page 951 > Article

Journal of Terahertz Science and Electronic Information Technology
Vol. 18, Issue 5, 951 (2020)

Nondestructive testing of MCS dielectric defect based on A-Scan and C-Scan of Ultrasonic Test

HE Zhigang, LIANG Dongcheng, GONG Guohu, and WANG Xiaomin^*

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[in Chinese]

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DOI: 10.11805/tkyda2019052 Cite this Article

HE Zhigang, LIANG Dongcheng, GONG Guohu, WANG Xiaomin. Nondestructive testing of MCS dielectric defect based on A-Scan and C-Scan of Ultrasonic Test[J]. Journal of Terahertz Science and Electronic Information Technology , 2020, 18(5): 951 Copy Citation Text

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References

[7] KISHI H,MIZUNO Y,CHAZONO H. Base-metal electrode-multilayer ceramic capacitors:past,present and future perspectives[J]. Japanese Journal of Applied Physics, 2003(42):1-15.

[10] KOSTIC A D,SCHWARTZ S W. Optimized acoustic microscopy screening for multilayer ceramic capacitors[C]// 2011 Proceedings―Annual Reliability and Maintainability Symposium. Lake Buena Vista,FL,USA:IEEE, 2011.

[13] JIANG Wei,HU Yongda,BAO Shengxiang,et al. Analysis on the causes of decline of MLCC insulation resistance[C]// 2015 16th International Conference on Electronic Packaging Technology(ICEPT). Changsha,China:IEEE, 2015.

[14] Department of Defense. General specification for capacitors,fixed,ceramic dielectric(Temperature Stable and General Purpose),high reliability:MIL-PRF-123D[S]. 2006-03-17.

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