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    Journals >Optics and Precision Engineering >Volume 12 >Issue 5 >Page 480 > Article
    • Optics and Precision Engineering
    • Vol. 12, Issue 5, 480 (2004)
    [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Optics and Precision Engineering, 2004, 12(5): 480 Copy Citation Text show less
    References

    [5] HOGREFE H, GIESENBERG D, HAELBICH R P. A New VUV-reflectometer for UHV-applications[J].Nuclear Instruments and Methods, 1983,208:415-418.

    [6] MIHIRO Y. Soft x-ray reflection from SiC, TiC, and WC mirrors[J].Appl. Opt. ,1986,25(24):4586-4590.

    [7] FUCHSchs D. HIGH precision soft x-ray reklectmeter[J].Rev. Sci. Instrum ,1995,66(2):2248-2250.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Optics and Precision Engineering, 2004, 12(5): 480
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