• Acta Photonica Sinica
  • Vol. 50, Issue 11, 1112005 (2021)
Xiaotian QIU1, Ailing TIAN1,*, Dasen WANG2, Xueliang ZHU1..., Bingcai LIU1 and Hongjun WANG1|Show fewer author(s)
Author Affiliations
  • 1School of Optoelectronic Engineering,Xi'an Technology University,Xi'an 710021,China
  • 2Inner Mongolia Metal Material Research Institute,Ningbo,Zhejiang 315103,China
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    DOI: 10.3788/gzxb20215011.1112005 Cite this Article
    Xiaotian QIU, Ailing TIAN, Dasen WANG, Xueliang ZHU, Bingcai LIU, Hongjun WANG. Fluorescence Microscopic Stereo Imaging Method to Measure the Depth of Subsurface Damage of Optical Components[J]. Acta Photonica Sinica, 2021, 50(11): 1112005 Copy Citation Text show less
    References

    [1] D F EDWARDS, P P HED. Optical glass fabrication technology. 1: Fine grinding mechanism using bound diamond abrasives. Applied Optics, 26, 4670-4676(1987).

    [2] P E MILLER, T I SURATWALA, L L WONG et al. The distribution of subsurface damage in fused silica, 5991, 1-25(2005).

    [3] Hualin WANG. Study of the position of subsurface damage depth based on total internal reflection method(2016).

    [4] Yan DENG, Qiao XU, Liqun CHAI et al. Total internal reflection microscopy :a subsurface defects identification technique in optically transparent components. High Power Laser and Particle Beams, 21, 835-840(2009).

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    [6] Hongjie LIU, Fengrui WANG, Feng GENG et al. Nondestructive detection of optics subsurface defects by fluorescence image technoque. Optics and Precision Engineering, 28, 50-59(2020).

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    [11] W B WILLIAMS, B A MULLANY, W C PARKER et al. Using quantum dots to evaluate subsurface damage depths and formation mechanisms in glass. The International Academy for Production Engineering Annals-Manufacturing Technology, 59, 569-572(2010).

    [12] W B WILLIAMS, B A MULLANY, W C PARKER et al. Using quantum dots to tag subsurface damage in lapped and polished glass samples. Applied Optics, 48, 5155-5163(2009).

    [13] W B WILLIAMS. A novel fluorescence based method of assessing subsurface damage in optical materials(2009).

    [14] H WANG, J HOU, J WANG et al. Experimental investigation of subsurface damage depth of lapped optics by fluorescent method. Journal of Central South University, 25, 1678-1689(2018).

    [15] Jing HOU, Hongxiang WANG, Chu WANG et al. Nondestructive fluorescence detection method for subsurface damage depth of optics. Journal of Harbin Institute of Technology, 50, 17-22(2018).

    Xiaotian QIU, Ailing TIAN, Dasen WANG, Xueliang ZHU, Bingcai LIU, Hongjun WANG. Fluorescence Microscopic Stereo Imaging Method to Measure the Depth of Subsurface Damage of Optical Components[J]. Acta Photonica Sinica, 2021, 50(11): 1112005
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