Yelu XU. Analysis and Improvement of Corner White Mura in TFT‑LCD[J]. Optoelectronic Technology, 2023, 43(2): 177
- Optoelectronic Technology
- Vol. 43, Issue 2, 177 (2023)
Fig. 1. Phenomenon of corner white dot
Fig. 2. Data types and analysis tools
Fig. 3. Microscopic phenomenon of corner white Mura
Fig. 4. Binary logistic regression analysis
Fig. 5. Iron analysis results of TOF-SIMS
Fig. 6. Curing process of sealant
Fig. 7. The guessed mechanism
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Table 1. Analysis methods
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Table 2. Experimental conditions and results
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