Image processing method for polarization detection of microdefects in optical components

Xiaohui CHEN; Xinsen WANG; Yafan DUAN

doi:10.3969/j.issn.1005-5630.202305100093

Journals >Optical Instruments >Volume 46 >Issue 5 >Page 24 > Article

Optical Instruments
Vol. 46, Issue 5, 24 (2024)

Image processing method for polarization detection of microdefects in optical components

Xiaohui CHEN¹, Xinsen WANG¹, and Yafan DUAN^1,2,3,*

Author Affiliations

¹Research Center for Photonics Technology, Quanzhou Normal University, Quanzhou 362000, China

²Fujian Key Laboratory of Advanced Micro-nano Photonics Technology and Devices, Quanzhou, 362000, China

³Fujian Collaborative Innovation Center for Ultra-precision Optical Engineering andApplication, Quanzhou 362000, China

show less

DOI: 10.3969/j.issn.1005-5630.202305100093 Cite this Article

Xiaohui CHEN, Xinsen WANG, Yafan DUAN. Image processing method for polarization detection of microdefects in optical components[J]. Optical Instruments, 2024, 46(5): 24 Copy Citation Text

show less

References

[8] GOLDSTEIN D H. Polarized light[M]. 3rd ed. Boca Raton: CRC Press, 2011: 808.

[11] JULIET RANI V, THANAMMAL K K. STFTSM: noise reduction using soft threshold-based fuzzy trimmed switch median filter[J]. Soft Computing, 26, 947-960(2022).

Xiaohui CHEN, Xinsen WANG, Yafan DUAN. Image processing method for polarization detection of microdefects in optical components[J]. Optical Instruments, 2024, 46(5): 24

Download Citation

Tools

Save the article for my favorites

Paper Information

微信扫一扫：分享

微信扫一扫：分享