• Electronics Optics & Control
  • Vol. 23, Issue 7, 79 (2016)
WANG Yongnan1, MU Xihui2, NIU Yueting2, and WANG Qi1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2016.07.017 Cite this Article
    WANG Yongnan, MU Xihui, NIU Yueting, WANG Qi. Storage Life Prediction of a Certain Accelerometer Based on Isotonic Regression[J]. Electronics Optics & Control, 2016, 23(7): 79 Copy Citation Text show less
    References

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    [4] WOHLGEMUTH J HSARAH K.Using accelerated testing to predict module reliability[C]//37th IEEE Photovoltaic Specialists Conference (PVSC 11)Seattle2011:1924.

    [5] LI X YJIANG T M.Optimal design for stepstress accelerated degradation with competing failure modes[C]//Annual Reliability and Maintainability Symposium2009:6468.

    [10] NARAYANASWAMY BERIC BMARIA K.Order restricted inference for exponential stepstress models[J].IEEE Transactions on Reliability200958(1):132142.

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    WANG Yongnan, MU Xihui, NIU Yueting, WANG Qi. Storage Life Prediction of a Certain Accelerometer Based on Isotonic Regression[J]. Electronics Optics & Control, 2016, 23(7): 79
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