• Electro-Optic Technology Application
  • Vol. 29, Issue 4, 65 (2014)
MA Xiao-hang, ZHU Ting-ling, and BIAN Xin-tian
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  • [in Chinese]
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    DOI: Cite this Article
    MA Xiao-hang, ZHU Ting-ling, BIAN Xin-tian. Three-dimensional Surface Figure Measurement Based on Three Step Phase-shifting[J]. Electro-Optic Technology Application, 2014, 29(4): 65 Copy Citation Text show less
    References

    [2] LIU Y K, SU X Y, ZHANG Q C. A novel encoded-phase technique for phase measuring profilometry [J]. Optics express, 2011, 19(15): 14137-14144.

    [5] BIAN X T, XUE J P, CHENG J, et al. Phase measuring profilometry based on elliptically pattern grating [J]. Optik, 2013, 124(19): 3924-3928.

    [6] Zhang S, Yau S T. High-speed three-dimensional shape measurement system using a modified two-plus-one phase-shifting algorithm [J]. Optical Engineering (S0091-3286), 2007, 46(11): 113603.

    MA Xiao-hang, ZHU Ting-ling, BIAN Xin-tian. Three-dimensional Surface Figure Measurement Based on Three Step Phase-shifting[J]. Electro-Optic Technology Application, 2014, 29(4): 65
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