New Planar Crystal X-ray Spectrometer with Independent Wavelength Calibration Ability

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Chinese Journal of Lasers >Volume 30 >Issue 2 >Page 167 > Article

Chinese Journal of Lasers
Vol. 30, Issue 2, 167 (2003)

New Planar Crystal X-ray Spectrometer with Independent Wavelength Calibration Ability

[in Chinese]^*, [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New Planar Crystal X-ray Spectrometer with Independent Wavelength Calibration Ability[J]. Chinese Journal of Lasers, 2003, 30(2): 167 Copy Citation Text

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Abstract

A novel method of measuring absolute X ray wavelengths using an auxiliary diaphragm attached to the planar crystal, which can accurately determine wavelengths without any reference line and any information or special position.

Keywords

auxiliary diaphragm laser plasma planar crystal spectrometer X-ray spectroscopy optical technique and instrument

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