Research on several test issues of electromagnetic radiation susceptibility for electronic equipment

Xiaodong Pan; Guanghui Wei; Haojiang Wan; Xinfu Lu; Kai Zhao

doi:10.11884/HPLPB202032.200088

Journals >High Power Laser and Particle Beams >Volume 32 >Issue 7 >Page 073002 > Article

High Power Laser and Particle Beams
Vol. 32, Issue 7, 073002 (2020)

Research on several test issues of electromagnetic radiation susceptibility for electronic equipment

Xiaodong Pan, Guanghui Wei, Haojiang Wan, Xinfu Lu, and Kai Zhao

Author Affiliations

National Key Laboratory of Science and Technology on Electromagnetic Environment Effects, Shijiazhuang Campus, Army Engineering University, Shijiazhuang 050003, China

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DOI: 10.11884/HPLPB202032.200088 Cite this Article

Xiaodong Pan, Guanghui Wei, Haojiang Wan, Xinfu Lu, Kai Zhao. Research on several test issues of electromagnetic radiation susceptibility for electronic equipment[J]. High Power Laser and Particle Beams, 2020, 32(7): 073002 Copy Citation Text

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References

[10] Hu Dezhou, Wei Guanghui, Pan Xiaodong. Investigation of the radiation immunity testing method in reverberation chambers[J]. IEEE Trans Electromagnetic Compatibility, 59, 1791-1797(2017).

[15] Pan Xiaodong, Wei Guanghui, Lu Xinfu. Research on wideband differential-mode current injection testing technique based on directional coupling device[J]. International Journal of Antennas and Propagation, 143068(2014).

[18] Li Wei, Wei Guanghui, Pan Xiaodong. Electromagnetic compatibility prediction method under the multifrequency in-band interference environment[J]. IEEE Trans Electromagnetic Compatibility, 60, 520-528(2018).

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