• Optoelectronics Letters
  • Vol. 15, Issue 2, 147 (2019)
Xiao TANG1, Yun-zhi XIA1, Wei FANG2、*, Yu-peng WANG2, and Xin YE2
Author Affiliations
  • 1University of South China, Hengyang 421001, China
  • 2Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
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    DOI: 10.1007/s11801-019-8117-2 Cite this Article
    TANG Xiao, XIA Yun-zhi, FANG Wei, WANG Yu-peng, YE Xin. International comparison of the SIAR measurement andthe WRR standard[J]. Optoelectronics Letters, 2019, 15(2): 147 Copy Citation Text show less
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    TANG Xiao, XIA Yun-zhi, FANG Wei, WANG Yu-peng, YE Xin. International comparison of the SIAR measurement andthe WRR standard[J]. Optoelectronics Letters, 2019, 15(2): 147
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