A Multi-Factor Based Sample Allocation Scheme for Testability Verification of Electromechanical Equipment

HE Yang; LI Hong-tao; WANG Zhi-xin

doi:10.3969/j.issn.1671-637x.2015.01.022

Journals >Electronics Optics & Control >Volume 22 >Issue 1 >Page 97 > Article

Electronics Optics & Control
Vol. 22, Issue 1, 97 (2015)

A Multi-Factor Based Sample Allocation Scheme for Testability Verification of Electromechanical Equipment

HE Yang, LI Hong-tao, and WANG Zhi-xin

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[in Chinese]

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DOI: 10.3969/j.issn.1671-637x.2015.01.022 Cite this Article

HE Yang, LI Hong-tao, WANG Zhi-xin. A Multi-Factor Based Sample Allocation Scheme for Testability Verification of Electromechanical Equipment[J]. Electronics Optics & Control, 2015, 22(1): 97 Copy Citation Text

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References

[2] PATTIPATI K R,ALEXANDRIDIS M G.Application of heuristic search and information theory to sequential fault diagnosis［J］.IEEE Transactions on Systems,Man,and Cybernetics,1990,20(4)：872-887．

HE Yang, LI Hong-tao, WANG Zhi-xin. A Multi-Factor Based Sample Allocation Scheme for Testability Verification of Electromechanical Equipment[J]. Electronics Optics & Control, 2015, 22(1): 97

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