Image denoising exploiting inter- and intra-scale dependency in complex wavelet domain

[in Chinese]; [in Chinese]

Journals >Chinese Optics Letters >Volume 5 >Issue 3 >Page 156 > Article

Chinese Optics Letters
Vol. 5, Issue 3, 156 (2007)

Image denoising exploiting inter- and intra-scale dependency in complex wavelet domain

[in Chinese]^1、2 and [in Chinese]¹

Author Affiliations

¹School of Science, National University of Defense Technology, Changsha 410073

²Institute of Automation, Chinese Academy of Sciences, Beijing 100080

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[in Chinese], [in Chinese]. Image denoising exploiting inter- and intra-scale dependency in complex wavelet domain[J]. Chinese Optics Letters, 2007, 5(3): 156 Copy Citation Text

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References

[1] D. L. Donoho and I. M. Johnstone, J. Am. Stat. Assoc. 90, 1200 (1995).

[2] E. P. Simoncelli, in Bayesian Inference in Wavelet Based Models P. Muller and B. Vidakovic, (eds.) (Springer-Verlag, New York, 1999) Chap.18, pp.291-308.

[3] M. S. Crouse, R. D. Nowak, and R. G. Baraniuk, IEEE Trans. Signal Proc. 46, 886 (1998).

[4] L. Sendur and I. W. Selesnick, IEEE Trans. Signal Proc. 50, 2744 (2002).

[5] Y. Chen and C. Han, Electron. Lett. 41, 1586 (2005).

[6] J. Liu and P. Moulin, IEEE Trans. Image Proc. 10, 1647 (2001).

[7] N. Kingsbury, Appl. Comput. Harmon. Anal. 10, 234 (2001).

[8] I. W. Selesnick, R. G. Baraniuk, and N. G. Kingsbury, IEEE Signal Processing Magazine 22, 123 (2005).

[9] H. Wang, L. Cheng, and Y. Wu, J. Computer-Aided Design and Computer Graphics (in Chinese) 17, 1911 (2005).

[10] J. K. Romberg, H. Choi, and R. G. Baraniuk, in Proceedings of IEEE Int. Conf. Image Processing 1, 614 (2001).

[11] E. P. Simoncelli, Proc. SPIE 3813, 188 (1999).

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[in Chinese], [in Chinese]. Image denoising exploiting inter- and intra-scale dependency in complex wavelet domain[J]. Chinese Optics Letters, 2007, 5(3): 156

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