XU Wei, YUAN Qun, GAO Zhishan, YU Haobiao, SUN Yifeng, QU Yi. Review of microsphere optical microscopy for super-resolution imaging and metrology[J]. Journal of Applied Optics, 2019, 40(6): 1139

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- Journal of Applied Optics
- Vol. 40, Issue 6, 1139 (2019)
Abstract

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