Zifeng Zhao, Guozheng Wang, Ziheng Hao, Ni Zhang, Jun Ge, Jikai Yang. Simulation of the effect of hole shape on performance of CsI: Tl scintillation screens based on silicon microchannel arrays[J]. High Power Laser and Particle Beams, 2024, 36(6): 064003
- High Power Laser and Particle Beams
- Vol. 36, Issue 6, 064003 (2024)
Fig. 1. Schematic diagram of X-ray detection
Fig. 2. Schematic structure of two silicon microchannel array (SMA) based CsI:Tl scintillation screens
Fig. 3. SMA-based 3D geometric models of CsI:Tl scintillation screen
Fig. 4. Variation of the number of generated scintillation photons with the thickness of the scintillation screen
Fig. 5. Variation of scintillation photon number with X-ray energy
Fig. 6. Relationship between BLO and thickness of scintillation screen
Fig. 7. Transmission efficiency versus scintillation screen thickness
Fig. 8. Number of scintillating photons subjected to n total reflections as a proportion of the total number of scintillating photons
Fig. 9. MTF versus spatial resolution for CsI:Tl flicker screens
Fig. 10. SEM image of SMA
Fig. 11. Schematic diagram of X ray equipment
Fig. 12. Data processing of edge method
Fig. 13. Relationship between MTF and spatial resolution of sample wafers
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