• Optoelectronic Technology
  • Vol. 43, Issue 3, 269 (2023)
Hao LIU, Tianqi ZHAO, Chunlian ZHAN, Yanxia ZOU, and Shangzhong JIN
Author Affiliations
  • College of Optical and Electronic Technology, China Jiliang University, Hangzhou 310018, CHN
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    DOI: 10.19453/j.cnki.1005-488x.2023.03.014 Cite this Article
    Hao LIU, Tianqi ZHAO, Chunlian ZHAN, Yanxia ZOU, Shangzhong JIN. Research on High Precision Vacuum Ultraviolet Spectroradiometer Technology[J]. Optoelectronic Technology, 2023, 43(3): 269 Copy Citation Text show less
    Outline diagram of vacuum ultraviolet spectroradiometer
    Fig. 1. Outline diagram of vacuum ultraviolet spectroradiometer
    Off‑axis aspherical double reflection ultraviolet optical system
    Fig. 2. Off‑axis aspherical double reflection ultraviolet optical system
    Performance test of vacuum ultraviolet filter
    Fig. 3. Performance test of vacuum ultraviolet filter
    Reflectivity of the mirror at incident angles of 15 ° and 45 °
    Fig. 4. Reflectivity of the mirror at incident angles of 15 ° and 45 °
    Simulation curves of influence of MgF2 protective layer thickness on aluminum mirror reflectivity
    Fig. 5. Simulation curves of influence of MgF2 protective layer thickness on aluminum mirror reflectivity
    Internal structure diagram of MCP-PMT
    Fig. 6. Internal structure diagram of MCP-PMT
    Dark current curve of MCP-PMT over time
    Fig. 7. Dark current curve of MCP-PMT over time
    Dark current graph as a function of vacuum
    Fig. 8. Dark current graph as a function of vacuum
    Curve chart of signal to noise ratio as a function of bias voltage
    Fig. 9. Curve chart of signal to noise ratio as a function of bias voltage
    Photocathode sensitivity curves
    Fig. 10. Photocathode sensitivity curves
    Photo of vacuum chamber
    Fig. 11. Photo of vacuum chamber
    Simulation nephogram of static displacement and stress of vacuum chamber
    Fig. 12. Simulation nephogram of static displacement and stress of vacuum chamber
    Simulation nephogram of stress and static displacement of upper cover of cabin
    Fig. 13. Simulation nephogram of stress and static displacement of upper cover of cabin
    Chart of spectral radiance test result
    Fig. 14. Chart of spectral radiance test result
    Responsiveness curve near the center wavelength of 121.2 nm
    Fig. 15. Responsiveness curve near the center wavelength of 121.2 nm
    Responsiveness curve near the center wavelength of 135.6 nm
    Fig. 16. Responsiveness curve near the center wavelength of 135.6 nm
    Responsiveness curve near the center wavelength of 160 nm
    Fig. 17. Responsiveness curve near the center wavelength of 160 nm
    Responsiveness curve near the center wavelength of 180 nm
    Fig. 18. Responsiveness curve near the center wavelength of 180 nm
    Responsiveness curve near the center wavelength of 200 nm
    Fig. 19. Responsiveness curve near the center wavelength of 200 nm
    Spectroradiometer working wavelength signal-to-noise ratio curve
    Fig. 20. Spectroradiometer working wavelength signal-to-noise ratio curve
    Hao LIU, Tianqi ZHAO, Chunlian ZHAN, Yanxia ZOU, Shangzhong JIN. Research on High Precision Vacuum Ultraviolet Spectroradiometer Technology[J]. Optoelectronic Technology, 2023, 43(3): 269
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