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    Journals >Chinese Optics Letters >Volume 8 >Issue 4 >Page 361 > Article
    • Chinese Optics Letters
    • Vol. 8, Issue 4, 361 (2010)
    Influence of annealing temperature on the performance of Ge film and photon-counting imaging system
    Feifei Zhao1、2, Baosheng Zhao1, Xiaofeng Sai1, Xinghua Zhang1、2, Yonglin Wei1, and Wei Zou1
    Author Affiliations
  • 1State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China
  • 2Graduate University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/COL20100804.0361 Cite this Article Set citation alerts
    Feifei Zhao, Baosheng Zhao, Xiaofeng Sai, Xinghua Zhang, Yonglin Wei, Wei Zou, "Influence of annealing temperature on the performance of Ge film and photon-counting imaging system," Chin. Opt. Lett. 8, 361 (2010) Copy Citation Text show less
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    Article index updated: Feb. 24, 2023
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    The article is cited by 2 article(s) from Web of Science.
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    Feifei Zhao, Baosheng Zhao, Xiaofeng Sai, Xinghua Zhang, Yonglin Wei, Wei Zou, "Influence of annealing temperature on the performance of Ge film and photon-counting imaging system," Chin. Opt. Lett. 8, 361 (2010)
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