Research on a 3-D Measuring Method for Buildings Based on Fixed Scanning Points

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 30 >Issue 1 >Page 50 > Article

Opto-Electronic Engineering
Vol. 30, Issue 1, 50 (2003)

Research on a 3-D Measuring Method for Buildings Based on Fixed Scanning Points

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Research on a 3-D Measuring Method for Buildings Based on Fixed Scanning Points[J]. Opto-Electronic Engineering, 2003, 30(1): 50 Copy Citation Text

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Abstract

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Research on a 3-D Measuring Method for Buildings Based on Fixed Scanning Points[J]. Opto-Electronic Engineering, 2003, 30(1): 50

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