• Journal of Terahertz Science and Electronic Information Technology
  • Vol. 19, Issue 1, 162 (2021)
LIU Minqiang*, DU Chuanhua, XU Wei, ZHU Xiaofeng, and XU Xianguo
Author Affiliations
  • [in Chinese]
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    DOI: 10.11805/tkyda2019399 Cite this Article
    LIU Minqiang, DU Chuanhua, XU Wei, ZHU Xiaofeng, XU Xianguo. MEMS accelerator and its radiation effects[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(1): 162 Copy Citation Text show less
    References

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    [9] QUADRI G,NICOT J M,Guibaud G,et al. Optomechanical microswitch behavior in a space radiation environment[J]. IEEE Transactions on Nuclear Science, 2005,52(5):1795-1799.

    [10] MIYAHIRA T F,BECKER H N,MCCLURE S S,et al. Total dose degradation of MEMS opticalmirrors[J]. IEEE Transactions on Nuclear Science, 2003,50(6):1860-1866.

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    [12] SHEA H R,GASPARYAN A,CHAN H B, et al. Effects of electrical leakage currents on MEMS reliability and performance[J]. IEEE Transactions on Device and Materials Reliability, 2004,4(2):198-207.

    LIU Minqiang, DU Chuanhua, XU Wei, ZHU Xiaofeng, XU Xianguo. MEMS accelerator and its radiation effects[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(1): 162
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