• Electronics Optics & Control
  • Vol. 28, Issue 10, 49 (2021)
HAN Lu, SHI Xianjun, and ZHAI Yuyao
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2021.10.011 Cite this Article
    HAN Lu, SHI Xianjun, ZHAI Yuyao. A Hierarchical Testability Modeling Method Based on Bayesian Network[J]. Electronics Optics & Control, 2021, 28(10): 49 Copy Citation Text show less
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    HAN Lu, SHI Xianjun, ZHAI Yuyao. A Hierarchical Testability Modeling Method Based on Bayesian Network[J]. Electronics Optics & Control, 2021, 28(10): 49
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