• Acta Photonica Sinica
  • Vol. 46, Issue 12, 1231002 (2017)
ZHAO Fei1、2、*, YANG Wen1、2, MO Jing-hui1、2, ZHANG Zhi-heng1、2, and YANG Pei-zhi1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/gzxb20174612.1231002 Cite this Article
    ZHAO Fei, YANG Wen, MO Jing-hui, ZHANG Zhi-heng, YANG Pei-zhi. Influence of Pulse Sputtering Power on the Structural and Optical Properties of SiCx Thin Films Containing Silicon Quantum Dots[J]. Acta Photonica Sinica, 2017, 46(12): 1231002 Copy Citation Text show less
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    [4] WEISS C, SCHNABEL M, REICHERT A, et al. Structural and optical properties of silicon nanocrystals embedded in silicon carbide: Comparison of single layers and multilayer structures[J]. Applied Surface Science, 2015, 351: 550-557.

    [5] ZI Xing-fa, YANG Wen, YANG Peng-zhi, et al. Fabrication and optical properties of N-doped Cu2O thin films deposited by RF magnetron sputtering[J]. Journal of Optoelectronics·Laser, 2014: 1727-1731.

    [6] HARTEL A M, KNLE M, LPER P, et al. Amorphous SixC1-x: H single layers before and after thermal annealing: correlating optical and structural properties[J]. Solar Energy Materials & Solar Cells, 2010, 94(11): 1942-1946.

    [7] SONG D Y, CHO E C, CONIBEER G, et al. Fabrication and characterization of Si nanocrystals in SiC matrix produced by magnetron cosputtering[J]. Journal of Vacuum Science & Technology, 2007, 25(4): 1327-1335.

    [8] CHEN Xiao-bo, SONG Zhao-ning, YANG Wen, et al. Properties of silicon quantum dots embedded in silicon nitride deposited by magnetron co-sputtering[J]. Journal of Nanoelectronics & Optoelectronics, 2014, 9(4): 534-537.

    [9] LI P L, GAU C, LIU C W. Correlation between photo response and nanostructures of silicon quantum dots in annealed Si-rich nitride films[J]. Thin Solid Films, 2013, 529(529): 185-189.

    [10] CHANG G R, MAL F, MA D Y, et al. Multi-band silicon quantum dots embedded in an amorphous matrix of silicon carbide[J]. Nanotechnology, 2010, 21(46): 2612-2617.

    [11] ZHAO Fei, YANG Wen, CHEN Xiao-bo, et al. Influence of annealing technology on the spectral properties of SiCx thin films containing silicon quantum dots[J]. Acta Optica Sinica, 2017, 37(1): 01310021.

    [12] LIAO Wu-gang, ZENG Xiang-bin, WENGuo-zhi, et al. Photoluminescences and structure performances of Si-rich silicon nitride thin films containing Si quantum dots[J]. Acta Physica Sinica, 2013, 62(12): 126801-126801.

    [13] SONG D, CHO E C, CHO Y H, et al. Evolution of Si (and SiC) nanocrystal precipitation in SiC matrix[J]. Thin Solid Films, 2008, 516(12): 3824-3830.

    [14] LEE Y J, CHO T C, CHUANG S S, et al. Low-temperature microwave annealing processes for future IC fabrication-a review[J]. IEEE Transactions on Electron Devices, 2014, 61(3): 651-665.

    [15] ZHAO Fei, YANG Wen, CHEN Xiao-bo, et al. Influence of substrate temperature on the structural and optical properties of SiCx Thin films containing silicon quantum dots[J]. Journal of Synthetic Crystals, 2016, 45(8): 2044-2049.

    [16] XU Ling, WU Qi, DONG Cheng-yuan. Effect of annealing temperature on performance of amorphous InWO thin film transistors[J]. Chinese Journal of Luminescence, 37(4): 457-462.

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    ZHAO Fei, YANG Wen, MO Jing-hui, ZHANG Zhi-heng, YANG Pei-zhi. Influence of Pulse Sputtering Power on the Structural and Optical Properties of SiCx Thin Films Containing Silicon Quantum Dots[J]. Acta Photonica Sinica, 2017, 46(12): 1231002
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