• Infrared and Laser Engineering
  • Vol. 32, Issue 1, 57 (2003)
[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Deflection angle measurement system using PSD for a 2 DOF laser scanner[J]. Infrared and Laser Engineering, 2003, 32(1): 57 Copy Citation Text show less

    Abstract

    The basic principle and structural design of 2 DOF tip/tilt laser scanner are introduced. Two different methods to measure the 2 DOF deflection angle of the scanner are discussed, including their mathematical models, computing expression and optical systems. The aspects of PSD output signal processing circuit and sample-hold circuit to eliminate the environmental noise are presented. Displacement calibration demonstrates that the system can reach a wide measurement range of 30° and angle resolution of 0.01° as well as fast response and high stability.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Deflection angle measurement system using PSD for a 2 DOF laser scanner[J]. Infrared and Laser Engineering, 2003, 32(1): 57
    Download Citation